BS IEC 62951-9:2022 BSl Standards Publication Semiconductor devices Flexible and stretchable semiconductor devices Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells bsi. BSIEC 62951-9:2022 BRITISH STANDARD National foreword This British Standard is the UK implementation of IEC 62951-9:2022 The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors. A list of organizations represented on this committee can be obtained on request to its committee manager. Contractual and legal considerations This publication has been prepared in good faith, however no representation, warranty, assurance or undertaking (express or implied) is or will be made, and no responsibility or liability is or will be accepted by BsI in relation to the adequacy, accuracy, completeness or liability is expressly disclaimed to the full extent permitted by the law. This publication is provided as is, and is to be used at the recipient's own risk. The recipient is advised to consider seeking professional guidance with respect to its use of this publication. This publication is not intended to constitute a contract. Users are responsible for its correct application. @ The British Standards Institution 2022 Published by BSI Standards Limited 2022 ISBN 978 0539144376 ICS 31.080.01; 31.080.99 Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 December 2022. Amendments/corrigenda issued since publication Date Text affected BS IEC 62951-9:2022 IEC IEC62951-9 Edition 1.0 2022-12 INTERNATIONAL STANDARD colour inside Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.080.99 ISBN 978-2-8322-6222-1 Warning! Make sure that you obtained this publication from an authorized distributor.
IEC 62951-9 2022 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9 Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
文档预览
中文文档
22 页
50 下载
1000 浏览
0 评论
309 收藏
3.0分
温馨提示:本文档共22页,可预览 3 页,如浏览全部内容或当前文档出现乱码,可开通会员下载原始文档
本文档由 人生无常 于 2025-01-24 16:45:25上传分享